First‐order Raman scattering of the MAX phases: Ti2AlN, Ti2AlC0.5N0.5, Ti2AlC, (Ti0.5V0.5)2AlC, V2AlC, Ti3AlC2, and Ti3GeC2
Top Cited Papers
- 2 August 2011
- journal article
- Published by Wiley in Journal of Raman Spectroscopy
- Vol. 43 (1), 168-172
- https://doi.org/10.1002/jrs.3036
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Substrate orientation effects on the nucleation and growth of the Mn+1AXn phase Ti2AlCJournal of Applied Physics, 2011
- Synthesis, Microstructure, and Mechanical Properties of Ti3Sn(1−x)AlxC2 MAX Phase Solid SolutionsInternational Journal of Applied Ceramic Technology, 2010
- Epitaxial Ti2AlN(0001) thin film deposition by dual-target reactive magnetron sputteringActa Materialia, 2007
- Growth and characterization of MAX-phase thin filmsSurface and Coatings Technology, 2005
- phases in thesystem studied by thin-film synthesis andab initiocalculationsPhysical Review B, 2004
- Mechanical Properties of the MAX PhasesPublished by Elsevier BV ,2004
- Kink formation around indents in laminated Ti3SiC2 thin films studied in the nanoscaleScripta Materialia, 2003
- The MN+1AXN phases: A new class of solidsProgress in Solid State Chemistry, 2000
- Synthesis and Characterization of a Remarkable Ceramic: Ti3SiC2Journal of the American Ceramic Society, 1996
- Kohlenstoffhaltige tern re Verbindungen (H-Phase)Monatshefte für Chemie / Chemical Monthly, 1963