A New Approach for Contamination Measurements for EDM Dielectrics
- 1 January 1987
- journal article
- Published by Elsevier BV in CIRP Annals
- Vol. 36 (1), 111-113
- https://doi.org/10.1016/s0007-8506(07)62565-7
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Theoretical basis for the statistics of dielectric breakdownJournal of Physics C: Solid State Physics, 1983
- On the influence of mechanical perturbation on the breakdown of a liquid dielectricJournal of Electrostatics, 1979