The Czochralski growth of optical quality bismuth silicon oxide (Bi12SiO20)
- 1 December 1977
- journal article
- Published by Elsevier BV in Journal of Crystal Growth
- Vol. 42, 431-434
- https://doi.org/10.1016/0022-0248(77)90227-5
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- High-sensitivity read-write volume holographic storage in Bi12SiO20 and Bi12GeO20 crystalsApplied Physics Letters, 1976
- Simulated rotational instabilities in molten bismuth silicon oxideJournal of Crystal Growth, 1976
- The Czochralski growth of Bi12SiO20 crystalsJournal of Crystal Growth, 1974
- Imaging Characteristics of the Itek PROMApplied Optics, 1974
- The growth of single crystalline waveguiding thin films of piezoelectric sillenitesJournal of Crystal Growth, 1973