Effect of strain on thenoise of metal films
- 15 September 1983
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 28 (6), 3625-3627
- https://doi.org/10.1103/physrevb.28.3625
Abstract
The application of stress has been found to significantly affect the low-frequency excess noise of metal films. We find that in general the resulting noise is similar to the noise thought to be intrinsic to metals. Our results suggest that much of the noise observed in these systems may be caused by a process closely associated with strain relaxation.
Keywords
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