Process characterization of Niobium based Josephson integrated circuits
- 1 May 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 19 (3), 942-945
- https://doi.org/10.1109/tmag.1983.1062441
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Process characterization of Josephson circuitsJournal of Vacuum Science and Technology, 1981
- Fabrication Process for Josephson Integrated CircuitsIBM Journal of Research and Development, 1980