High-resolution topographical imaging by direct transmission electron microscopy
- 20 August 1974
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 30 (2), 447-451
- https://doi.org/10.1080/14786439808206570
Abstract
A technique of transmission electron microscopy which yields direct high-resolution topographical contrast is described. Examples of the application of the technique are given and a theoretical interpretation based upon the process of electron refraction is proposed. Further systems to which the technique may be applied are discussed.Keywords
This publication has 4 references indexed in Scilit:
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- Electron Microscope and Diffraction Study of Metal Crystal Textures by Means of Thin SectionsJournal of Applied Physics, 1949
- Dark-Field Electron Microscopy. I. Studies of Crystalline Substances in Dark-FieldJournal of Applied Physics, 1948
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