Dielectric constant measurement of thin films by differential time-domain spectroscopy
- 29 May 2000
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 76 (22), 3221-3223
- https://doi.org/10.1063/1.126587
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- A reliable method for extraction of material parameters in terahertz time-domain spectroscopyIEEE Journal of Selected Topics in Quantum Electronics, 1996
- Far-infrared time-domain spectroscopy with terahertz beams of dielectrics and semiconductorsJournal of the Optical Society of America B, 1990