The influence of defects in excision and error prone repair on spontaneous and induced mitotic recombination and mutation in Saccharomyces cerevisiae
- 1 January 1978
- journal article
- research article
- Published by Springer Nature in Molecular Genetics and Genomics
- Vol. 161 (1), 81-88
- https://doi.org/10.1007/bf00266618
Abstract
No abstract availableThis publication has 29 references indexed in Scilit:
- Repair of pyrimidine dimers in radiation-sensitive mutants rad3, rad4, rad6 and rad9 of Saccharomyces cerevisiaeMutation Research, 1977
- Estimation of the length of cell cycle phases from asynchronous cultures of Saccharomyces cerevisiaeExperimental Cell Research, 1976
- Post-meiotic segregation in strains of Saccharomycescerevisiae unable to excise pyrimidine dimersMutation Research, 1976
- A yeast strain for simultaneous detection of induced mitotic crossing over, mitotic gene conversion and reverse mutationMutation Research, 1975
- Repair systems in SaccharomycesMutation Research, 1974
- Suppressor studies on ilv1 mutants of Saccharomyces cerevisiaeMutation Research, 1973
- A yeast strain for visual screening for the two reciprocal products of mitotic crossing overMutation Research/Environmental Mutagenesis and Related Subjects, 1973
- The genetic control of dark recombination in yeastMutation Research, 1971
- Dominance and recessiveness at the protein level in mutant x wildtype crosses in Saccharomyces cerevisiaeMolecular Genetics and Genomics, 1969
- The isolation, genetics and survival characteristics of ultraviolet light-sensitive mutants in yeastMutation Research, 1968