Thickness Dependence of the Quantum Yield of Cesium‐Antimony Films
- 1 January 1968
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 27 (1), 145-150
- https://doi.org/10.1002/pssb.19680270115
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Die Bestimmung der Austrittstiefe von Photoelektronen in Caesium–Antimon-SchichtenPhysica Status Solidi (b), 1968
- Interferenz-Photokathoden erhöhter Ausbeute mit frei wählbarem spektralem MaximumThe European Physical Journal A, 1958
- Theory of Secondary EmissionPhysical Review B, 1957
- Mechanism of Exciton-Enhanced Photoelectric Emission in Alkali HalidesPhysical Review B, 1951