Atomic and electronic contributions to Si(111)-(7×7) scanning-tunneling-microscopy images
- 15 July 1986
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 34 (2), 1388-1391
- https://doi.org/10.1103/physrevb.34.1388
Abstract
Bias-dependent scanning tunneling microscopy (STM), used in conjunction with atomic-charge superposition calculations, is shown to provide information on both atomic and electronic surface structure. Si(111)-(7×7) STM images measured with different bias voltages are compared with a number of recent structural models. Striking agreement is found with the stacking-fault-adatom model of Takayanagi. The unit-cell asymmetry found at negative sample bias is attributed to a stacking fault in one half of the unit cell, locally modifying the surface electronic structure.Keywords
This publication has 17 references indexed in Scilit:
- Real-space observation ofπ-bonded chains and surface disorder on Si(111)2×1Physical Review Letters, 1986
- Real-Space Observation of Surface States on Si(111) 7×7 with the Tunneling MicroscopePhysical Review Letters, 1985
- Charge-density waves observed with a tunneling microscopePhysical Review Letters, 1985
- Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopyJournal of Vacuum Science & Technology A, 1985
- Voltage-dependent scanning-tunneling microscopy of a crystal surface: GraphitePhysical Review B, 1985
- Tests of Si(111)−7 × 7 structural models by comparison with transmission electron diffraction patternsSurface Science, 1984
- New adatom model for Si(111) 7×7 and Si(111)-Ge 5×5 reconstructed surfacesPhysical Review B, 1984
- Modified milk-stool on wurtzite layer model for Si(111) 7 × 7 surface reconstructionSurface Science, 1984
- Structure Analysis of the Si(111)7 × 7 Surface by Low-Energy Ion ScatteringPhysical Review Letters, 1983
- 7 × 7 Reconstruction on Si(111) Resolved in Real SpacePhysical Review Letters, 1983