Investigation of very fast and high-current transients in digital bipolar IC's using both a new compact model and a device simulator
- 1 May 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 30 (5), 551-562
- https://doi.org/10.1109/4.384168
Abstract
No abstract availableKeywords
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