Design of high-vacuum test station for rapid evaluation of vacuum microelectronic devices
- 1 January 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 38 (10), 2350-2354
- https://doi.org/10.1109/16.88524
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
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