An Automatic X-Ray Reflection Specimen Holder for the Quantitative Determination of Preferred Orientation

Abstract

A reflection specimen holder has been developed, which has several new features. A removable jig, which fits into the inner ring, is used for the rapid alignment of the specimen. Two different specimen scanning devices are described, which allow the primary beam to cover successively a large number of grains in the specimen surface while the diffracted intensity is being measured. Since many such time consuming measurements are required for an accurate pole figure, the operation of the instrument and the recording of the data have been made automatic.