Precise force curve detection system with a cantilever controlled by magnetic force feedback
- 1 November 1997
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 68 (11), 4132-4136
- https://doi.org/10.1063/1.1148357
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force MicroscopyScience, 1995
- Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force MicroscopeJapanese Journal of Applied Physics, 1995
- Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force MicroscopyScience, 1995
- Observation of 7×7 Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force MicroscopyJapanese Journal of Applied Physics, 1995
- Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopySurface Science, 1993
- Measuring the nanomechanical properties and surface forces of materials using an atomic force microscopeJournal of Vacuum Science & Technology A, 1989
- High-resolution capacitance measurement and potentiometry by force microscopyApplied Physics Letters, 1988
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986
- A Modification to a Precision Balance Incorporating Substitution Weighing and Feedback Control which gives Improved Accuracy and ConvenienceMetrologia, 1975