Angle-Resolved Secondary-Electron—Emission Spectra from Si(111)7×7 Surface States
- 17 March 1975
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 34 (11), 674-677
- https://doi.org/10.1103/physrevlett.34.674
Abstract
In angle-resolved secondary-electron—emission spectra from a silicon (111)7×7 surface there are two series of peaks which are not in the spectra of the unreconstructed (111)1×1 surface. These peaks are interpreted by a two-step model; electrons are excited into surface-state resonances lying above the vacuum level, from which states they emerge into the vacuum. The dispersion curves of these states are presented and discussed.Keywords
This publication has 12 references indexed in Scilit:
- Realistic Tight-Binding Calculations of Surface States of Si and Ge (111)Physical Review Letters, 1974
- Secondary electron energy spectra of single-crystal Fe(110) at various emission anglesJournal of Physics D: Applied Physics, 1974
- The electronic structure of the (111) surface of siliconJournal of Physics C: Solid State Physics, 1973
- Surface States and Surface Bonds of Si(111)Physical Review Letters, 1973
- Surface-state resonances in low-energy electron diffractionSurface Science, 1971
- Structure and transformation characteristics of impurity stabilized phases on the Si(111) surfaceSurface Science, 1971
- Contaminants on chemically etched silicon surfaces: LEED-Auger methodSurface Science, 1970
- Slow electron scattering from metals: I. The emission of true secondary electronsSurface Science, 1969
- Fine Structure Measurements in the Energy Angular Distribution of Secondary Electrons from a (110) Face of CopperPhysica Status Solidi (b), 1968
- Angular Distribution of Secondary Electrons from (100) Faces of Copper and NickelPhysical Review B, 1960