A Beam Profile Indicator with Solid State Detectors
- 1 June 1964
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 11 (3), 431-440
- https://doi.org/10.1109/tns.1964.4323459
Abstract
The instrument described in this paper was built with the purpose of providing a display of the profile of secondary beams from high energy accelerators. It is capable of handling 105 particles per cm2 per machine pulse, assuming a 20 msec spill. The profile is measured by an array of 32 semiconductor detectors, 4 nm apart and arranged in the form of a cross. The detectors count the individual impinging particles. The total numbers of counts on each detector are fed continuously to a multichannel scaler, which in turn delivers an analogue live display and a digital printout. Details of the electronics and methods of fabrication of the detectors, as well as their problems, are discussed.Keywords
This publication has 8 references indexed in Scilit:
- Beam Profile Monitor for Linear Electron AcceleratorReview of Scientific Instruments, 1963
- Beam-Profile DetectorReview of Scientific Instruments, 1963
- Production of Thick Semiconductor Radiation Detectors by Lithium DriftingIEEE Transactions on Nuclear Science, 1963
- Magnetic Lens System of Unit Magnification for High Energy Charged ParticlesReview of Scientific Instruments, 1962
- A beam profile indicator for use with high energy particle acceleratorsNuclear Instruments and Methods, 1962
- High Energy Beam Profile Detectors for Low FluxesReview of Scientific Instruments, 1961
- Diffusion of Li in Si at Highand the Isotope EffectPhysical Review B, 1960
- Range-Energy Relations for Protons in Be, C, Al, Cu, Pb, and AirPhysical Review B, 1959