Beam deviation method as a diagnostic tool for the plasma focus
- 15 April 1978
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 17 (8), 1275-1279
- https://doi.org/10.1364/ao.17.001275
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.This publication has 1 reference indexed in Scilit:
- An infrared Schlieren interferometer for measuring electron density profilesPlasma Physics, 1972