Atomic-scale contrast mechanism in atomic force microscopy
- 1 October 1992
- journal article
- research article
- Published by Springer Nature in Zeitschrift für Physik B Condensed Matter
- Vol. 88 (3), 321-326
- https://doi.org/10.1007/bf01470920
Abstract
No abstract availableKeywords
This publication has 23 references indexed in Scilit:
- Optical-beam-deflection atomic force microscopy: The NaCl (001) surfaceApplied Physics Letters, 1990
- Atomic resolution on LiF (001) by atomic force microscopyZeitschrift für Physik B Condensed Matter, 1990
- Different Response of Atomic Force Microscopy and Scanning Tunnelling Microscopy to Charge Density WavesEurophysics Letters, 1989
- Theoretical interpretation of atomic-force-microscope images of graphiteSurface Science, 1989
- Comparative study of lithium fluoride and graphite by atomic force microscopy (AFM)Journal of Microscopy, 1988
- Atomic resolution with the atomic force microscope on conductors and nonconductorsJournal of Vacuum Science & Technology A, 1988
- Atomic resolution imaging of a nonconductor by atomic force microscopyJournal of Applied Physics, 1987
- Atomic Resolution with Atomic Force MicroscopeEurophysics Letters, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986
- Study of Gas-Graphite Potential by Means of Helium Atom DiffractionPhysical Review Letters, 1978