Diffuse x-ray scattering and the structure of oxide layers on real GaAs(111) surfaces
- 1 February 1982
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 88 (1), 1-8
- https://doi.org/10.1016/0040-6090(82)90344-3
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- An X‐Ray Photoelectron Spectroscopy Study of Native Oxides on GaAsJournal of the Electrochemical Society, 1979
- MOS processing for III–V compound semiconductors: Overview and bibliographyThin Solid Films, 1977
- Evaluation of a New Polish for Gallium Arsenide Using a Peroxide-Alkaline SolutionJournal of the Electrochemical Society, 1971
- Preliminary Results on the Oxidation of GaAs and GaP during Chemical EtchingJournal of the Electrochemical Society, 1971
- Crystal Dynamics of Gallium ArsenidePhysical Review B, 1963