Application of analytical electron microscopy to diffusivity measurement requiring X-ray absorption correction
- 1 November 1990
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine Letters
- Vol. 62 (5), 365-370
- https://doi.org/10.1080/09500839008215157
Abstract
X-ray microanalysis using an analytical electron microscope is applied to diffusivity measurements in an alloy system where the X-ray absorption correction is imperative. It is shown that the differential X-ray absorption (DXA) method is useful for the absorption correction in the determination of a concentration gradient across a diffusion couple interface.Keywords
This publication has 9 references indexed in Scilit:
- Applicability of the differential X-ray absorption method to the determinations of foil thickness and local composition in the analytical electron microscopePhilosophical Magazine A, 1989
- Simplification of X-ray absorption correction in thin-sample quantitative microanalysisUltramicroscopy, 1987
- Determination of the interdiffusion coefficients in the Fe-Ni and Fe-Ni-P Systems Below 900 °CMetallurgical Transactions A, 1986
- Interdiffusion in the Ta-W systemJournal of Applied Physics, 1985
- Low temperature diffusivity measurements in the FeNi system using STEM techniquesMetallurgical Transactions A, 1983
- The determination of foil thickness by scanning transmission electron microscopyPhysica Status Solidi (a), 1975
- The quantitative analysis of thin specimensJournal of Microscopy, 1975
- A Curvature in the In D versus 1/T Plot for Self‐Diffusion in Nickel at Temperatures from 980 to 1400°CPhysica Status Solidi (b), 1968
- Self-diffusion and interdiffusion in gold-nickel alloysActa Metallurgica, 1957