Time-of-flight secondary ion mass spectrometry (TOF-SIMS) of polyisoprenes
- 1 March 1996
- journal article
- research article
- Published by Springer Nature in Microchimica Acta
- Vol. 122 (1-2), 1-15
- https://doi.org/10.1007/bf01252400
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
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