Ultrafast dynamics of hot electrons and holes in copper: Excitation, energy relaxation, and transport effects
- 15 May 1998
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 57 (20), 12812-12824
- https://doi.org/10.1103/physrevb.57.12812
Abstract
Time-resolved two-photon photoemission (2PPE) at various photon energies is used to investigate the relaxation dynamics of hot electrons in Cu(111), applying auto- and cross-correlation techniques. The relaxation times vary from 250 fs at 0.1 eV above the Fermi level to 20 fs at 2 eV and show a strong wavelength dependence in the vicinity of the -band feature in the 2PPE spectra. Electrons not directly excited from the band exhibit a much longer relaxation time than -band electrons excited to the same intermediate-state energy. We attribute these apparently longer lifetimes to a delayed electron generation via Auger decay of -band holes. Based on a band structure calculation, a simulation of the ballistic transport effect and its implication on the observed electron relaxation dynamics is presented for the three low-index copper surfaces. These observations suggest that -band holes have a substantially longer lifetime than excited -band electrons of the corresponding excitation energy.
Keywords
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