Averaging of low exposure electron micrographs of non-periodic objects
- 1 January 1975
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 1 (2), 159-162
- https://doi.org/10.1016/s0304-3991(75)80020-9
Abstract
No abstract availableKeywords
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- The Fourier Transform of an Electron Micrograph: Effects of Defocussing and Aberrations, and Implications for the Use of Underfocus Contrast EnhancementBerichte der Bunsengesellschaft für physikalische Chemie, 1970