Photoelectric Yield of Aluminum from 300 to 1300 Å

Abstract

The photoelectric yield of aluminum type 5086‐H32 containing 94% Al and 4% Mg has been measured at wavelengths between 300 and 1300 Å. At 584 Å the yield increased by 50% when the angle of incidence was changed from 0 to 50°. At 1026 Å the yield remained nearly constant for such a rotation. In general the yield was a function of the wavelength, the angle of incidence, and the degree of polarization of the incident radiation. The photoelectric yields were found to be stable and reproducible.