Abstract
Ellipsometric experiments have been performed on thick evaporated films of Na and K both by single reflection at free surfaces and by multiple reflection at metal-fused silica interfaces. The results are in qualitative agreement with the nearly-free-electron model, exhibiting no anomalous peaks and showing interband transitions with thresholds at the expected frequencies. The values deduced for the optical masses are 1.14m for Na and 1.17m for K.

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