Electron-yield extended x-ray absorption fine structure with the use of a gas-flow electron detector
- 1 January 1984
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 29 (1), 491-492
- https://doi.org/10.1103/physrevb.29.491
Abstract
We report the first electron-yield extended x-ray absorption fine-structure (EXAFS) measurements on a thick sample at ambient pressure using an ion chamber situated directly in the incident photon beam. An electron-detected EXAFS spectrum of an iron plate was acquired using a windowless, He-flow ion chamber at atmospheric pressure, thus extending the useful application of EXAFS to samples previously inaccessible by conventional techniques or not suited to ultrahigh vacuum environments.Keywords
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