Origin of Dielectric Relaxation Observed for Ba0.5Sr0.5TiO3 Thin-Film Capacitor
- 1 September 1996
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 35 (9S), 5178-5180
- https://doi.org/10.1143/jjap.35.5178
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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