Oxygen impurities at the homoepitaxially grown diamond-substrate interface analyzed by secondary ion mass spectrometry
- 31 January 1996
- journal article
- Published by Elsevier in Diamond and Related Materials
- Vol. 5 (1), 34-37
- https://doi.org/10.1016/0925-9635(95)00337-1
Abstract
No abstract availableKeywords
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