X rays and raman sensitivity differences in heterogeneous a-Si:H from pure L.P.C.V.D.
- 1 December 1983
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 59-60, 205-208
- https://doi.org/10.1016/0022-3093(83)90557-4
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Proton Magnetic Resonance Spectra of Plasma-Deposited Amorphous Si: H FilmsPhysical Review Letters, 1980
- Vibrational properties of amorphous Si and GePhysical Review B, 1975