Precision Measurement of Lattice Imperfections with a Photographic Two-Crystal Method
- 1 March 1965
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 36 (3), 334-338
- https://doi.org/10.1063/1.1719566
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- X-Ray Wavelength Conversion FactorPhysical Review B, 1965
- Angle Measuring InterferometerReview of Scientific Instruments, 1964
- Precision Redetermination of Standard Reference Wavelengths for X-Ray SpectroscopyPhysical Review B, 1964
- DIFFRACTION ANGLE MEASUREMENTS BEARING ON THE DEUTERIUM BINDING ENERGY AND ON THE X-UNIT-TO-MILLIANGSTROM CONVERSION CONSTANTCanadian Journal of Physics, 1962
- Resolving Power of the Two-Crystal X-Ray SpectrometerReview of Scientific Instruments, 1935