Preparation and Characterization of Grain Boundary Josephson Junction from Amorphous Thin Film
- 1 May 1991
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 30 (5R), 929-933
- https://doi.org/10.1143/jjap.30.929
Abstract
To prepare the grain boundary Josephson junction, Y-Ba-Cu-O amorphous thin film was first etched into a bridge shape and then annealed at a high temperature, 990°C, to form grain boundaries. The bridge thus prepared showed clear Shapiro steps under the irradiation of microwaves at 4.2 K. Grains of the films sensitively varied their structures, sizes and electric properties with annealing temperature. The grains annealed at a lower temperature, 960°C, were as small as a few micrometers or less. Large grains appeared when the annealing temperature became higher, and the higher the annealing temperature, the greater the number of large grains, untill 990°C. The bridge of 5 µm in width that had grains over 10 µm in size exhibited a.c. Josephson effect, but the effect was not observed with the bridge which consisted of only small grains of a few µm.Keywords
This publication has 5 references indexed in Scilit:
- Microwave irradiated effects in microbridge of r.f. sputtered YBaCuO thin filmSolid State Communications, 1989
- Bridge Type Josephson Junctions in MO-CVD Thin FilmsJapanese Journal of Applied Physics, 1989
- Response of YBaCuO thin-film microbridges to microwave irradiationApplied Physics Letters, 1989
- Bulk dc SQUID in a Tl-based ceramic: Shapiro steps, signal, and noise properties at 77 KApplied Physics Letters, 1989
- Josephson effect and macroscopic quantum interference in high-T/sub c/ superconducting thin-film weak links at 77 KIEEE Transactions on Magnetics, 1989