Bimorph-driven x–y–z translation stage for scanned image microscopy

Abstract

We have developed an x–y–z scanning stage for mechanically scanned microscopy. The stage is constructed of ‘‘double‐S’’ mode piezoelectric bimorphs. The prototype unit has a deflection sensitivity of 0.3 μm/V and a travel in each of the three axes of ±60 μm. The lowest mechanical resonances of the stage are at 190, 220, and 360 Hz, corresponding to the x, y, and z axes of the stage, respectively. The noise level of the stage, when mounted on an isolation table, is ∼0.1 nm. The performance of the stage can be understood in terms of a simple lumped element model which can be used to optimize such stages for particular applications.