Identification of a bivalent flaw in n-GaAs from noise measurements
- 1 January 1973
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 12 (1), 39-42
- https://doi.org/10.1016/0038-1098(73)90340-2
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Generation-Recombination Noise in-Type Gold-Doped GermaniumPhysical Review Letters, 1961
- Irreversible Thermodynamics and Carrier Density Fluctuations in SemiconductorsPhysical Review B, 1958