Coupling Errors in Cavity-Resonance Measurements on MIC Dielectrics (Short Papers)
- 1 August 1973
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 21 (8), 560-562
- https://doi.org/10.1109/tmtt.1973.1128061
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A Quick Accurate Method to Measure the Dielectric Constant of Microwave Integrated-Circuit Substrates (Short Papers)IEEE Transactions on Microwave Theory and Techniques, 1973
- A Simple Technique for the Accurate Determination of the Microwave Dielectric Constant for Microwave Integrated Circuit Substrates (Correspondence)IEEE Transactions on Microwave Theory and Techniques, 1971