Cr75Si25 thin films—Temperature dependence of electrical properties and microstructure
- 31 August 1986
- journal article
- Published by Elsevier in Acta Metallurgica
- Vol. 34 (8), 1491-1504
- https://doi.org/10.1016/0001-6160(86)90094-5
Abstract
No abstract availableKeywords
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