Atom Probe Tomography: A Technique for Nanoscale Characterization

1 June 2004

journal article
research article
Published by Oxford University Press (OUP) in Microscopy and Microanalysis

Vol. 10 (3), 336-341
https://doi.org/10.1017/s1431927604040577

Abstract

Atom probe tomography is a technique for the nanoscale characterization of microstructural features. Analytical techniques have been developed to estimate the size, composition, and other parameters of features as small as 1 nm from the atom probe tomography data. These methods are outlined and illustrated with examples of yttrium-, titanium-, and oxygen-enriched particles in a mechanically alloyed, oxide-dispersion-strengthened steel.

Keywords

This publication has 21 references indexed in Scilit:

Implementation of an optical TAP: preliminary results
Ultramicroscopy, 1998
On the many advantages of local-electrode atom probes
Ultramicroscopy, 1996
Investigation of some selected metallurgical problems with the tomographic atom probe
Applied Surface Science, 1994
On the development of a 3D tomographic atom-probe
Applied Surface Science, 1993
Implementation of the optical atom probe
Surface Science, 1992
Concepts in atom probe designs
Surface Science, 1991
Proposed configurations for a high-repetition-rate position-sensitive atom probe
Surface Science, 1991
Marching cubes: A high resolution 3D surface construction algorithm
ACM SIGGRAPH Computer Graphics, 1987
The Atom Probe and Markov Chain Statistics of Clustering
Technometrics, 1974
The Atom Probe and Markov Chain Statistics of Clustering
Technometrics, 1974

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