Twinning of Iridium in a Field Ion Microscope
- 1 June 1966
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 37 (7), 2593-2595
- https://doi.org/10.1063/1.1782089
Abstract
Multiple twinning of [111]‐oriented iridium crystals caused by the field stress is observed in a field ion microscope. The twin plane is pure (111) and the direction of shear [112̄]. The twins are formed only at small tip radii. The twins are stable enough to survive annealing to 1000°C and controlled field evaporation of many atomic layers.Keywords
This publication has 3 references indexed in Scilit:
- Field Ion MicroscopyScience, 1965
- The effect of polarization, field stress, and gas impact on the topography of field evaporated surfacesSurface Science, 1964
- Das FeldionenmikroskopThe European Physical Journal A, 1951