Comments on "Fault Testing and Diagnosis in Combinational Digital Circuits"
- 1 August 1969
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-18 (8), 760
- https://doi.org/10.1109/T-C.1969.222761
Abstract
To be of general value, a digital fault diagnosis method must be able to handle intermittent and multiple faults.Keywords
This publication has 1 reference indexed in Scilit:
- Fault Testing and Diagnosis in Combinational Digital CircuitsIEEE Transactions on Computers, 1968