Rotation between SEM micrograph and electron channelling patterns
- 1 May 1976
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 9 (5), 341-343
- https://doi.org/10.1088/0022-3735/9/5/007
Abstract
Rotation between the normal image seen in the scanning electron microscope (SEM) and electron channelling patterns (ECP) has previously been found for the deflection focus system for generating selected area ECP (SAECP). The rotation is examined for the after-lens deflection system also used for generating SAECP and difference between various modes of SEM use are characterised.Keywords
This publication has 4 references indexed in Scilit:
- The rotation between selected area channelling patterns and micrographs in the SEMJournal of Materials Science, 1975
- Rotation between SEM micrograph and electron channelling patternsJournal of Physics E: Scientific Instruments, 1975
- Rotation between micrographs from the scanning electron microscope and electron channelling patternsJournal of Physics E: Scientific Instruments, 1974
- Zur Bestimmung der Orientierung kubischer Kristalle bezüglich beliebiger Raumrichtungen mit Hilfe der Selected Area Diffraction (SAD)-Methode im Rasterelektronenmikroskop / The Determination of the Orientation of Cubic Crystals Relative to any Desired Direction Using Electron Channelling Patterns in the Scanning Electron MicroscopePractical Metallography, 1973