Effect of chemical environment on the intensities ofx-ray satellites produced in heavy-ion collisions
- 1 March 1977
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 15 (3), 914-925
- https://doi.org/10.1103/physreva.15.914
Abstract
High-resolution measurements of ion-excited x-ray spectra have been performed for a variety of Al, Si, S, and Cl compounds. An examination of the satellite intensity distribution revealed significant variations from one compound to another. This effect has been attributed to alteration of the and/or vacancy transfer rates due to the influence of chemical environment. The systematic trend displayed by the data tends to suggest that interatomic processes are important in the deexcitation of these highly ionized systems.
Keywords
This publication has 18 references indexed in Scilit:
- Theoretical fluorescence yields for neonPhysical Review A, 1975
- dependence ofx-ray satellite structure in heavy-ion—atom collisionsPhysical Review A, 1974
- Silicon and silicon dioxidex-ray spectra from hydrogen, helium, and oxygen bombardmentPhysical Review A, 1974
- Simultaneous-Plus--Shell Ionization in Light-Ion-Atom CollisionsPhysical Review A, 1973
- Chemical Effects on Ion-Excited AluminumX-Ray SpectraPhysical Review A, 1972
- Molecular structure effects of aluminum Kβ x-ray spectra produced in proton and alpha particle excitationPhysics Letters A, 1972
- Resolved Structure inX Rays Produced by 30-MeV Oxygen IonsPhysical Review Letters, 1971
- Aluminum X-Ray Satellite Enhancement by Ion-Impact ExcitationPhysical Review Letters, 1971
- Dependence of fluorescence yield on atomic configurationJournal of Physics B: Atomic and Molecular Physics, 1971
- X-Ray Spectra from Oxygen-Ion Bombardments on Ca and V at 15 MeVPhysical Review Letters, 1970