A high-yield IC-compatible multichannel recording array
- 1 July 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 32 (7), 1206-1211
- https://doi.org/10.1109/t-ed.1985.22102
Abstract
This paper reports the development of a multielectrode recording array for use in studies of information processing in the central nervous system and in the closed-loop control of neural prostheses. The probe utilizes a silicon supporting carrier which is defined using a deep boron diffusion and an anisotropic etch stop. This substrate supports an array of polysilicon or tantalum thin-film conductors insulated above and below with silicon nitride and silicon dioxide. Typical probe dimensions include a length of 3 mm, shank width of 50 µm, and a thickness of 15 µm. These structures are capable of simultaneous high-amplitude multichannel recording of neural activity in the cortex. The probe fabrication process requires only four masks and is single-sided using wafers of normal thickness, resulting in yields which exceed 80 percent. The process is also compatible with the inclusion of on-chip MOS circuitry for signal amplification and multiplexing. A complete ten-channel signal processor which requires only three external probe leads is being developed.Keywords
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