A radiation thermometer for temperature control of thin samples during PIXE analysis
- 1 March 1987
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 22 (1-3), 45-48
- https://doi.org/10.1016/0168-583x(87)90291-6
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Control of temperature in thin samples during ion beam analysisNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
- Analytical application of particle induced X-ray emissionNuclear Instruments and Methods, 1976