High voltage distribution measurements using different sphere gaps

1 July 1967

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE

Vol. 55 (7), 1232-1233
https://doi.org/10.1109/PROC.1967.5811

Abstract

A curve was deduced giving the maximum sphere gap against the sphere diameter so that the corresponding discharge potential will not depend on the positions of the spheres. The distortion effect in the original field was eliminated by extrapolating the results obtained to the case of a testing sphere of zero diameter.

Keywords

VOLTAGE MEASUREMENT
CIRCUITS
TEMPERATURE
COLLISION MITIGATION
SYSTEM TESTING
SEMICONDUCTOR MATERIALS
SEMICONDUCTOR DIODES
MERCURY (METALS)
MATERIALS TESTING
SEMICONDUCTOR DEVICE TESTING

Cited by 1 article