Electrical Characteristics of the Pt/SrBi2.4Ta2O9/ZrO2/Si Structure for Metal–Ferroelectric-Insulator–Semiconductor Field-Effect-Transistor Application
- 15 September 2002
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 41 (Part 1, No), 5645-5649
- https://doi.org/10.1143/jjap.41.5645