Charge pumping and low-frequency noise in MOS structures

Publisher Website

16 December 1971

journal article
research article
Published by Wiley in Physica Status Solidi (a)

Vol. 8 (2), 545-550
https://doi.org/10.1002/pssa.2210080225

Abstract

No abstract available

Keywords

This publication has 8 references indexed in Scilit:

Charge pumping in MOS devices
IEEE Transactions on Electron Devices, 1969
SURFACE-STATE RELATED l/f NOISE IN p-n JUNCTIONS AND MOS TRANSISTORS
Applied Physics Letters, 1968
1/f noise in gate-controlled planar silicon diodes
Electronics Letters, 1968
Surface states and 1/f noise in MOS transistors
IEEE Transactions on Electron Devices, 1967
The Si-SiO₂Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance Technique
Bell System Technical Journal, 1967
Evidence of the Surface Origin of the $\frac{1}{f}$ Noise
Physical Review Letters, 1966
Surface effects on p-n junctions: Characteristics of surface space-charge regions under non-equilibrium conditions
Solid-State Electronics, 1966
Solid Solubilities of Impurity Elements in Germanium and Silicon*
Bell System Technical Journal, 1960

Cited by 6 articles