Determination of Preferred Orientation in Flat Transmission Samples Using a Geiger Counter X-Ray Spectrometer
- 1 November 1949
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 20 (11), 1033-1036
- https://doi.org/10.1063/1.1698269
Abstract
A method employing a diverging x‐ray beam is described for the determination of preferred orientation in flat transmission samples with a Geiger counter x‐ray spectrometer. It is shown that for a certain range of sample thickness the counting rate is independent of the rotation of the samples, and therefore, no correction formula is required.Keywords
This publication has 1 reference indexed in Scilit:
- Preferred Orientation Determination Using a Geiger Counter X-Ray Diffraction GoniometerJournal of Applied Physics, 1948