Determination of optical properties of absorbing materials: a generalized scheme
- 15 February 1983
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 22 (4), 587-591
- https://doi.org/10.1364/ao.22.000587
Abstract
A generalized reflectance method for determination of optical properties of absorbing materials is developed and compared with other reflectance methods. In the present scheme the specimen is coated with dielectric transparent layer(s) and the reflectance ratios are measured. This novel scheme of specimen preparation and the method of measurement allow the specimen to be free from surface layers and at the same time account for possible effects of surface roughness. It can be applied to a wide variety of materials regardless of their surface conditions and is particularly useful for metals.This publication has 5 references indexed in Scilit:
- Reflectance method for determination of optical properties of absorbing materialsJournal of Physics D: Applied Physics, 1982
- The optical properties of amorphous and crystalline germaniumJournal of Physics C: Solid State Physics, 1976
- Determination of the optical constants of thin absorbing filmsThin Solid Films, 1972
- Nouvelle méthode simple de détermination des constantes optiques de cristaux absorbants dans l'infrarouge application à quelques carbonatesJournal de Physique, 1967
- Comparison of Reflection Methods for Measuring Optical Constants without Polarimetric Analysis, and Proposal for New Methods based on the Brewster AngleProceedings of the Physical Society, 1961