On the problems of multiple overlayers in ellipsometry and a new look at multiple angle of incidence ellipsometry
- 2 December 1976
- journal article
- Published by Elsevier in Surface Science
- Vol. 61 (2), 515-520
- https://doi.org/10.1016/0039-6028(76)90063-7
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Ellipsometric study of lithium hydroxide overlayers on lithiumSurface Science, 1976
- Specular reflectivity studies of the electrosorption of aromatic hydrocarbons on gold electrode in 2-methoxyethanol solutionSurface Science, 1974
- New Method for Accurate Determination of Optical ConstantsApplied Optics, 1972
- Differential reflection spectroscopy of very thin surface filmsSurface Science, 1971
- Error analysis of angle of incidence measurementsSurface Science, 1969