Picosecond gain and saturation measurements of the 353-nm XeF laser line
- 1 December 1977
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 31 (11), 747-749
- https://doi.org/10.1063/1.89525
Abstract
The spectral characteristics, temporal gain profile, and saturation energy have been measured for the 353‐nm XeF laser line using a picosecond probe pulse of the third harmonic of a Nd : glass laser.Keywords
This publication has 10 references indexed in Scilit:
- A scalable multiatmosphere high-power XeF laserApplied Physics Letters, 1977
- Radiative lifetime of the C state of XeFThe Journal of Chemical Physics, 1977
- XeF* (C1/2) radiative lifetime measurementApplied Physics Letters, 1977
- Generation of single synchronizable picosecond 1.06-μm pulsesApplied Physics Letters, 1977
- Picosecond XeF amplified laser pulsesApplied Physics Letters, 1977
- Properties of single picosecond pulses from neodymium:Phosphate glassOptics Communications, 1977
- Electron-beam-controlled discharge pumping of the XeF laserApplied Physics Letters, 1976
- Synchronizable actively mode-locked Nd:glass laserApplied Physics Letters, 1976
- 354-nm laser action on XeFApplied Physics Letters, 1975
- Theory of Pulse Propagation in a Laser AmplifierJournal of Applied Physics, 1963