Design of an atomic force microscope and first results
- 2 October 1987
- journal article
- Published by Elsevier in Surface Science
- Vol. 189-190, 29-35
- https://doi.org/10.1016/s0039-6028(87)80411-9
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Atomic Resolution with Atomic Force MicroscopeEurophysics Letters, 1987
- Experimental Observation of Forces Acting during Scanning Tunneling MicroscopyPhysical Review Letters, 1986
- Atomic Force MicroscopePhysical Review Letters, 1986
- Scanning tunneling microscope combined with a scanning electron microscopeReview of Scientific Instruments, 1986
- 7 × 7 Reconstruction on Si(111) Resolved in Real SpacePhysical Review Letters, 1983
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982